Atomic Force Microscope (Model No. NTEGRA Vita from NT-MDT).:

Atomic Force Microscope (AFM) or scanning probe microscope (SPM) is an advanced highresolution microscope consisting of cantilever with a sharp tip (probe) at its end that is used to scan the specimen surface. The main advantage of atomic force microscope is that the sample need not be conducting.

Applications:

• Surface morphology of physical and biological samples.
• Surface mapping of magnetic material.
• Current mapping.
• NanoLithography.
• Nanoindentation.
• STM.