X-ray diffraction (XRD) is a rapid analytical technique primarily used for phase identification of a crystalline material. Both powder as well as thin film samples can be analysed.
XRD equipment at IASST:
Model: D8 Advance, Manufacturer: Bruker AXS, Germany
Applications:
Phase identification of powder samples.
Phase identification of thin films.
Crystallite size determination.
Grazing incidence XRD
X-ray reflectivity analysis
With specialized techniques, XRD can be used to:
determine crystal structures using Rietveld refinement.
determine of modal amounts of minerals (quantitative analysis).
characterize thin films samples by:
determining dislocation density and quality of the film by rocking curve measurements
measuring superlattices in multilayered epitaxial structures
determining the thickness, roughness and density of the film using glancing incidence X-ray reflectivity measurements.
make textural measurements, such as the orientation of grains, in a polycrystalline sample.
